Keeping you informed with the latest 
news, research, new products and events.

New atomic force microscope

Veeco Instruments Inc. has released the Dimension Edge atomic force microscope (AFM) system for physical and life sciences investigation. The mid-priced system has a proprietary closed-loop and drift-compensated stage that allows the productivity, accuracy, and sample versatility of a large-sample, closed-loop system combined with the high-resolution images traditionally only achieved by small-sample, open-loop systems. The system’s lower noise levels allows collection of the fine details critical to material identification, while protecting fragile tips and samples, and diminishing tip artifacts. The microscope has a 5-megapixel digital camera and an180 to 1465 μm viewing area. It can be used for applications such as characterizing solar and semiconductor devices, mapping of heterogeneous polymer-based materials, and in situ imaging of life science samples from single molecules to whole cells.

More information here.



Microscopy News © 2008 using D'Bluez Theme Designed by Ipiet Supported by Tadpole's Notez Based on FREEmium theme Blogger Templates