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HD comes to electron microscopy

Carl Zeiss has introduced the EVO HD conventional scanning electron microscope (SEM). The system delivers higher resolution at low acceleration voltages compared to present conventional SEM and bring High Definition to electron microscopy.

The new EVO HD source has a higher brightness, which offers a better resolution at low-kV than conventional tungsten SEMs. The source also aids analytical applications, giving a 30% increase in resolution at 30kV and 1nA.

The company says that numerous applications in both life sciences and materials analysis will benefit from the increased performance of the microscope.
Caption: This image of a scale from butterfly wing (Pieris Brassicae) was taken on the EVO HD electron microscope at 5kV acceleration voltage.

More information about the microscope here.



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