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Atomic force microscope for research and education

Agilent Technologies Inc. has introduced the Agilent 5420 atomic force microscope. Based on the company’s 5400 platform, the microscope has been engineered to deliver lower noise, better performance, and greater versatility. It can be used for materials science, polymers, electrical characterization, and general surface characterization applications

The microscope comes with an undergraduate course curriculum and samples for teaching labs. Several performance-enhancing options are available, including an open-loop and closed-loop X-Y & Z 90 micron scanner, a 9 micron open-loop scanner, and a 10 micron STM scanner. For high-resolution imaging in liquid, Agilent’s MAC Mode is available. Precision thermal control can be added as well. Get specifications and read about additional options here.



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